In-Circuit Testing is an automated, early-stage electronics testing method for production defects.

In-Situ Dynamic Thermal Cycling Stress Testing is an electronics testing method of exposing products from high to low temperature extremes for several cycles, which identities potential early product failures.

Integrated Circuits (IC) are single, integrated components containing a large number of discreet components, such as transistors and other semiconductor devices, as well as the layering which interconnect all of the semiconductor devices.

Interconnect are the specialized, high-precision optical and electrical cable and harness assemblies and connectors utilized in the interconnection of electrical components and assemblies. Various interconnect technologies include single-mode and multi-mode cyber optics, coaxial, ribbon cable, shielded and tight pair, tight twisted pairs, patch cords and molded cables.